XPS (X-Ray Photoelectron Spectroscopy)
UPS (Ultraviolet Photoelectron Spectroscopy)
AES (Auger Electron Spectroscopy)
ISS (Ion Scattering Spectroscopy)
Depth profiling (ARXPS, sputtering)
SEM (Scanning Electron Microscopy)
SAM (Scanning Auger Microscopy)
STM (Scanning Tunneling Microscopy)
PVD (Physical Vapor Deposition)
CVD (Chemical Vapor Deposition)
Low Energy Electron Irradiation
Sample heating/cooling
Sputtering
Wetbench
Optical Microscopes
Spin Coater
Photolithography
Optical Microscopes
Critical Point Dryer
Ozone Cleaner
Contact Angle Measurement System
Helium Ion Microscope Orion from Zeiss
ELPHY MultiBeam Pattern Generator from Raith (link to product)
Low Energy Electron Point Source (LEEPS) microscope
Nanomanipulator
Single nanowire experiments
Low Energy Electron Point Source (LEEPS) microscope
High resolution detector
Electron Holography
AFM (Atomic Force Microscopy)
STM (Scanning Tunneling Microscopy)
Electrochemistry
IRRAS (Infrared Reflection Absorption Spectroscopy)
ATR-IR (Attenuated Total Reflection Spectroscopy)
Low Energy Electron Irradiation
Ion-Source (15kV)
Duo-Plasmatron Ion-Source (30kV)
Space-/Timeresolved Fragment-Spectrometer